the Creative Commons Attribution 4.0 License.
the Creative Commons Attribution 4.0 License.
Single Event Effect Testing of the PNI RM3100 Magnetometer for Space Applications
- 1Climate and Space Sciences and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA
- 2NASA Goddard Space Flight Center, Code 561, Greenbelt, MD, 20771, USA
- 3NASA Goddard Space Flight Center, Code 673, Greenbelt, MD, 20771, USA
- 4NASA Goddard Space Flight Center, Code 549, Greenbelt, MD, 20771, USA
- 1Climate and Space Sciences and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA
- 2NASA Goddard Space Flight Center, Code 561, Greenbelt, MD, 20771, USA
- 3NASA Goddard Space Flight Center, Code 673, Greenbelt, MD, 20771, USA
- 4NASA Goddard Space Flight Center, Code 549, Greenbelt, MD, 20771, USA
Abstract. The results of a destructive single-event effect susceptibility radiation test of the PNI RM3100 magnetometer sensor, specifically the MagI2C ASIC (application specific integrated circuit) on the sensor board are presented. The sensor is a low-resource commercial-of-the-shelf (COTS) magneto-inductive magnetometer. The device was monitored for destructive events and functional interruptions during exposure to a heavy ion beam at the Lawrence Berkeley National Laboratory’s 88” Cyclotron. The RM3100 did not experience any destructive single-event effects when irradiated to a total fluence of 1.4 x 107/cm2 at an effective linear energy transfer (LET) of 76.7 MeVcm2/mg while operated at nominal voltage (3.3 V) and elevated temperature (85 °C). When these results are combined with previous total ionizing dose tests showing no failures up to 150 kRad(SI), we conclude that the PNI RM3100 is extremely radiation tolerant and can be used in a variety of space environments.
Mark Moldwin et al.
Status: final response (author comments only)
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RC1: 'Comment on gi-2022-5', Anonymous Referee #1, 31 Mar 2022
In "Single Event Effect Testing of the PNI RM3100 Magnetometer for Space Applications", by Mark Moldwin and others, the authors present results of radiation testing of the PNI RM3100 magnetometer sensor, taken to destruction, looking for evidence of single event effects. They conclude that "the PNI RM3100 is appropriate for use on missions in a variety of space environments (LEO polar, MEO, HEO, GEO, and deep space)."The paper is concise, and very well written, addressing a range of single event failure modes, all presented in suitable contexts.As space science evolves towards increasing use of small, and by inference lower cost scientific spacecraft, there is a clear need for the considered uses of COTS components. This paper contributes in a significant way towards those ends.This reader has only one question, not really a comment of the paper: Going forward is there a middle ground for such testing of the PNI RM3100, that is not destructive, but could still be beneficial in increasing the space-worthiness/reliability of this device?This reader recommends publishing as is.
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AC1: 'Reply on RC1', Mark Moldwin, 06 Apr 2022
Referee Question: "Going forward is there a middle ground for such testing of the PNI RM3100, that is not destructive, but could still be beneficial in increasing the space-worthiness/reliability of this device?"
The standard practice and guidance is that “Microcircuits under test must be delidded [decapsulated].” This is to ensure knowledge of the LET through the circuitry as the cover of the IC could degrade the energy of the beam before reaching the circuitry.JEDEC, "Test procedure for the management of single-event effects in semiconductor devices from heavy ion irradiation," JESD57A, Nov 2017https://ieeexplore.ieee.org/document/4638609"The experimenter should know within reasonable accuracy the LET through the device sensitive volume. The test facility typically reports the initial LET and surface LET as the ion exits the source. However, the experimenter should take care to understand beam degradation through air and other mediums before the sensitive volume. Overburden layers can be significant in some high-density modern ICs. Also, some device types have deep structures that require a long ion range to penetrate the sensitive volume, in order to trigger some destructive effects. So, it is always beneficial to have information on the device dimensions, or be conservative in the beam energy and ion range."
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AC1: 'Reply on RC1', Mark Moldwin, 06 Apr 2022
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RC2: 'Comment on gi-2022-5', David Miles, 05 Apr 2022
The authors present the results of single event testing of the COTS PNI RM3100 magnetometer as a significant step towards the qualification of the device for future space missions. The tested devices did not experience any destructive events and experienced only rare functional interrupts that could be recovered by power cycling.
The manuscript is concise, well written, and generally compelling. I suggest the authors consider two minor revisions listed below; however, the manuscript is suitable for publication in Geoscientific Instrumentation, Methods and Data Systems.
1) The authors note that single event functional interrupts (SEFIs) were observed but rare. Could you quantify how frequently these occur?
2) The authors note, quite reasonably, that the magnetic readings inside the cyclotron facility are inherently noise and unlikely to be meaningful. Was any attempt made to assess if there was any residual damage from the SEFI events from the testing? For example, did the two tested units perform within manufacturer specifications after testing?
Mark Moldwin et al.
Mark Moldwin et al.
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