Suppression of very low frequency radio noise in transient electromagnetic data with semi-tapered gates

Larsen, Jakob Juul; Pedersen, Stine Søgaard; Foged, Nikolaj; Auken, Esben

doi:https://doi.org/10.5194/gi-10-81-2021

Articles | Volume 10, issue 1

https://doi.org/10.5194/gi-10-81-2021

© Author(s) 2021. This work is distributed under
the Creative Commons Attribution 4.0 License.

https://doi.org/10.5194/gi-10-81-2021

© Author(s) 2021. This work is distributed under
the Creative Commons Attribution 4.0 License.

Articles | Volume 10, issue 1

Research article

|

15 Apr 2021

Research article |

| 15 Apr 2021

Suppression of very low frequency radio noise in transient electromagnetic data with semi-tapered gates

Jakob Juul Larsen, Stine Søgaard Pedersen, Nikolaj Foged, and Esben Auken

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Final revised paper (published on 15 Apr 2021)
Preprint (discussion started on 28 Dec 2020)

Interactive discussion

Status: closed

AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment

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- Supplement

RC1: 'Frequency content', James Macnae, 24 Jan 2021
- AC1: 'Reply on RC1', Jakob Juul Larsen, 27 Jan 2021
RC2: 'Quite interesting paper!', Marco Antonio Couto Junior, 04 Feb 2021
- AC2: 'Reply on RC2', Jakob Juul Larsen, 06 Feb 2021

Peer-review completion

AR: Author's response | RR: Referee report | ED: Editor decision

AR by Jakob Juul Larsen on behalf of the Authors (24 Feb 2021) Author's response Author's tracked changes Manuscript

ED: Publish as is (08 Mar 2021) by Lev Eppelbaum

AR by Jakob Juul Larsen on behalf of the Authors (09 Mar 2021)

Short summary

The transient electromagnetic method (TEM) is widely used for mapping subsurface resistivity structures, but data are inevitably contaminated by noise from various sources including radio signals in the very low frequency (VLF) 3–30 kHz band. We present an approach where VLF noise is effectively suppressed with a new post-processing scheme where boxcar gates are combined into semi-tapered gates. The result is a 20 % increase in the depth of investigation for the presented test survey.