Articles | Volume 4, issue 1
Research article
02 Mar 2015
Research article |  | 02 Mar 2015

A new instrument to measure plot-scale runoff

R. D. Stewart, Z. Liu, D. E. Rupp, C. W. Higgins, and J. S. Selker


Interactive discussion

Status: closed
Status: closed
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Short summary
We present a new instrument for measuring surface runoff rates ranging from very low (~0.05L min-1) to high (300L min-1, with much higher rates possible depending on the device configuration). The device is economical, simple, rugged, accurate and requires little maintenance (the system is self-emptying and contains no moving parts). We have successfully used this instrument in long-term monitoring studies and expect that it will appeal to other scientists studying runoff processes.