Articles | Volume 8, issue 1
https://doi.org/10.5194/gi-8-97-2019
© Author(s) 2019. This work is distributed under
the Creative Commons Attribution 4.0 License.
the Creative Commons Attribution 4.0 License.
https://doi.org/10.5194/gi-8-97-2019
© Author(s) 2019. This work is distributed under
the Creative Commons Attribution 4.0 License.
the Creative Commons Attribution 4.0 License.
Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy
Dorothea S. Macholdt
Biogeochemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Climate Geochemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Biogeochemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Multiphase Chemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Maren Müller
Physics of Interfaces Department, Max Planck Institute for Polymer Research, 55128 Mainz, Germany
Bettina Weber
Multiphase Chemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Michael Kappl
Physics of Interfaces Department, Max Planck Institute for Polymer Research, 55128 Mainz, Germany
A. L. David Kilcoyne
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720-8229, USA
Markus Weigand
Modern Magnetic Systems Department, Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany
Jan Leitner
Particle Chemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Klaus Peter Jochum
Biogeochemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Climate Geochemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Biogeochemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Multiphase Chemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Meinrat O. Andreae
Biogeochemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Multiphase Chemistry Department, Max Planck Institute for Chemistry, 55128 Mainz, Germany
Geology and Geophysics Department, King Saud University, Riyadh 11451, Saudi Arabia
Data sets
Dataset for "Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy" J.-D. Förster and C. Pöhlker https://doi.org/10.17617/3.22
Short summary
Focused ion beam (FIB) slicing is a widely used technique to prepare ultrathin slices for the microanalysis of geological and environmental samples. During our investigations of the manganese oxidation states in rock varnish slices, we found an FIB-related reduction of manganese(IV) to manganese(II) at the samples’ surfaces. This study characterizes the observed reduction artifacts and emphasizes that caution is needed in the analysis of transition metal oxidation states upon FIB preparation.
Focused ion beam (FIB) slicing is a widely used technique to prepare ultrathin slices for the...