Geoscientific Instrumentation, Methods and Data Systems
Geoscientific Instrumentation, Methods and Data Systems
GI
Articles | Volume 8, issue 1
Articles | Volume 8, issue 1
https://doi.org/10.5194/gi-8-97-2019
© Author(s) 2019. This work is distributed under
the Creative Commons Attribution 4.0 License.
https://doi.org/10.5194/gi-8-97-2019
© Author(s) 2019. This work is distributed under
the Creative Commons Attribution 4.0 License.
Articles | Volume 8, issue 1
Research article
 | 
14 Mar 2019
Research article |  | 14 Mar 2019

Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy

Dorothea S. Macholdt, Jan-David Förster, Maren Müller, Bettina Weber, Michael Kappl, A. L. David Kilcoyne, Markus Weigand, Jan Leitner, Klaus Peter Jochum, Christopher Pöhlker, and Meinrat O. Andreae

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Latest update: 14 Dec 2024
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Short summary
Focused ion beam (FIB) slicing is a widely used technique to prepare ultrathin slices for the microanalysis of geological and environmental samples. During our investigations of the manganese oxidation states in rock varnish slices, we found an FIB-related reduction of manganese(IV) to manganese(II) at the samples’ surfaces. This study characterizes the observed reduction artifacts and emphasizes that caution is needed in the analysis of transition metal oxidation states upon FIB preparation.
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