Articles | Volume 8, issue 1
Geosci. Instrum. Method. Data Syst., 8, 97–111, 2019
https://doi.org/10.5194/gi-8-97-2019
Geosci. Instrum. Method. Data Syst., 8, 97–111, 2019
https://doi.org/10.5194/gi-8-97-2019

Research article 14 Mar 2019

Research article | 14 Mar 2019

Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy

Dorothea S. Macholdt et al.

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Interactive discussion

Status: closed
Status: closed
AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment
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Post-review adjustments

AA: Author's adjustment | EA: Editor approval
AA by Jan-David Förster on behalf of the Authors (06 Mar 2019)   Author's adjustment   Manuscript
EA: Adjustments approved (08 Mar 2019) by Maria Genzer
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Short summary
Focused ion beam (FIB) slicing is a widely used technique to prepare ultrathin slices for the microanalysis of geological and environmental samples. During our investigations of the manganese oxidation states in rock varnish slices, we found an FIB-related reduction of manganese(IV) to manganese(II) at the samples’ surfaces. This study characterizes the observed reduction artifacts and emphasizes that caution is needed in the analysis of transition metal oxidation states upon FIB preparation.